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1

Die Rechtsprechung des Bundesverfassungsgerichts zu den Grenzen richterlicher Entscheidungsfindung

Bodo Pieroth and Tobias Aubel

Journal:

JuristenZeitung

Année:

2003

Langue:

german

Fichier:

PDF, 1.48 MB

german, 2003

2

The Neuropsychological Profile and Phenomenology of Late Onset Psychosis: A Cross-sectional Study on the Differential Diagnosis of Very-Late-Onset Schizophrenia-Like Psychosis, Dementia with Lewy Bodies and Alzheimer’s Type Dementia with Psychosis

Van Assche, Lies, Van Aubel, Evelyne, Van de Ven, Lucas, Bouckaert, Filip, Luyten, Patrick, Vandenbulcke, Mathieu

Journal:

Archives of Clinical Neuropsychology

Année:

2018

Langue:

english

Fichier:

PDF, 272 KB

english, 2018

3

Lithium recovery from lithium-containing micas using sulfur oxidizing microorganisms

Reichel, S., Aubel, T., Patzig, A., Janneck, E., Martin, M.

Journal:

Minerals Engineering

Année:

2017

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2017

4

Blended care in the treatment of subthreshold symptoms of depression and psychosis in emerging adults: A randomised controlled trial of Acceptance and Commitment Therapy in Daily-Life (ACT-DL)

van Aubel, Evelyne, Bakker, Jindra Myrthe, Batink, Tim, Michielse, Stijn, Goossens, Liesbet, Lange, Iris, Schruers, Koen, Lieverse, Ritsaert, Marcelis, Machteld, van Amelsvoort, ThÃ©rÃ¨se, van Os, Jim

Journal:

Behaviour Research and Therapy

Année:

2020

Langue:

english

Fichier:

PDF, 584 KB

english, 2020

5

Highly accelerated electromigration lifetime test (HALT) of copper

Aubel, O., Hasse, W., Hommel, M.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2003

Langue:

english

Fichier:

PDF, 512 KB

english, 2003

6

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Practical considerations of process corner evaluation for deep-sub micron technology nodes using the example of its impact on electromigration

Aubel, Oliver, Hoffmann, Thomas

Année:

2010

Langue:

english

Fichier:

PDF, 351 KB

english, 2010

7

Digging into the past of nature carpets. The evaluation of treatments on artworks by Piero Gilardi made from polyurethane ether foam

van Aubel, Carien, de Groot, Suzan, van Keulen, Henk, Snijders, Evelyne

Journal:

Journal of Cultural Heritage

Année:

2019

Langue:

english

Fichier:

PDF, 3.10 MB

english, 2019

8

Trauma exposure and post-traumatic stress disorder in bipolar disorder

Hans-Jörg Assion, Nils Brune, Nadja Schmidt, Thomas Aubel, Marc-Andreas Edel, Miriam Basilowski, Georg Juckel, Ulrich Frommberger

Journal:

Social Psychiatry and Psychiatric Epidemiology

Année:

2009

Langue:

english

Fichier:

PDF, 215 KB

english, 2009

9

Investigation of the influence of thermal treatment on interconnect-barrier interfaces in copper metallization systems

Oliver Aubel, Eberhard Bugiel, Dietmar Krüger, Wolfgang Hasse, Martina Hommel

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 302 KB

english, 2006

10

Learning to Recognize Volcanoes on Venus

Michael C. Burl, Lars Asker, Padhraic Smyth, Usama Fayyad, Pietro Perona, Larry Crumpler, Jayne Aubele

Journal:

Machine Learning

Année:

1998

Langue:

english

Fichier:

PDF, 1.11 MB

english, 1998

11

G Protein–Coupled Receptors Revisited: Therapeutic Applications Inspired by Synthetic Biology

Heng, Boon Chin, Aubel, Dominique, Fussenegger, Martin

Journal:

Annual Review of Pharmacology

Année:

2014

Langue:

english

Fichier:

PDF, 1.94 MB

english, 2014

12

Einlagenrückgewähr, Prospekthaftung und Konzernrecht bei öffentlichen Angeboten von Aktien

Arnold, Michael, Aubel, Stephan

Journal:

Zeitschrift für Unternehmens und Gesellschaftsrecht

Année:

2012

Langue:

german

Fichier:

PDF, 242 KB

german, 2012

13

[AIP STRESS-INDUCED PHENOMENA IN METALLIZATION: Tenth International Workshop on Stress-Induced Phenomena in Metallization - Austin (Texas) (5–7 November 2008)] AIP Conference Proceedings - The Evolution of Barrier Properties During Reliability Testing of Cu Interconnects

Meyer, M. A., Aubel, O., Feustel, F., Engelmann, H. J., Zienert, I., Poppe, J., Gehre, D., Witt, C., Ho, Paul S., Zschech, Ehrenfried, Ogawa, Shinichi

Année:

2009

Langue:

english

Fichier:

PDF, 1.96 MB

english, 2009

14

Membrane-Based Conditioning of an Innovative Oil-Based Preservative for Food Technology

T. Aubel, R. Haseneder, J.-U. Repke

Journal:

Chemical Engineering & Technology

Année:

2011

Langue:

english

Fichier:

PDF, 310 KB

english, 2011

15

Determination of migration effects in Cu-via structures with respect to process-induced stress

Weide-Zaage, Kirsten, Zhao, Jiani, Ciptokusumo, Joharsyah, Aubel, Oliver

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 1.13 MB

english, 2008

16

Simulation of migration effects in nanoscaled copper metallizations

Weide-Zaage, Kirsten, Kashanchi, Farzan, Aubel, Oliver

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 1.34 MB

english, 2008

17

Investigation of stress distribution in via bottom of Cu-via structures with different via form by means of submodeling

Johar Ciptokusumo, Kirsten Weide-Zaage, Oliver Aubel

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 1.46 MB

english, 2009

18

Amino-caprolactam γ-secretase inhibitors showing potential for the treatment of Alzheimer’s disease

Martin L. Neitzel, Danielle L. Aubele, Jennifer L. Marugg, Jacek J. Jagodzinski, Andrei W. Konradi, Michael A. Pleiss, Balazs Szoke, Wes Zmolek, Erich Goldbach, Kevin P. Quinn, John-Michael Sauer, Eli

Journal:

Bioorganic & Medicinal Chemistry Letters

Année:

2011

Langue:

english

Fichier:

PDF, 1.80 MB

english, 2011

19

Copper–dielectric cap interface with enhanced reliability for 45 nm technology and beyond

J. Hohage, U. Mayer, M.U. Lehr, F. Feustel, O. Aubel, C. Hennesthal

Journal:

Microelectronic Engineering

Année:

2010

Langue:

english

Fichier:

PDF, 516 KB

english, 2010

20

20q13.2 Amplification in intraductal hyperplasia adjacent to in situ and invasive ductal carcinoma of the breast

M. Werner, Anita Mattis, Michaela Aubele, Margaret Cummings, Horst Zitzelsberger, Peter Hutzler, Heinz Höfler

Journal:

Virchows Archiv

Année:

1999

Langue:

english

Fichier:

PDF, 835 KB

english, 1999

21

Electron cyclotron resonance plasma ion beam effects on the formation of SiC on Si(001) characterized by in-situ photoemission

M. Diani, D. Aubel, J.L. Bischoff, L. Kubler, D. Bolmont

Journal:

Thin Solid Films

Année:

1994

Langue:

english

Fichier:

PDF, 470 KB

english, 1994

22

The role and influence of grandmothers on child nutrition: culturally designated advisors and caregivers

Journal:

Maternal & Child Nutrition

Année:

2012

Langue:

english

Fichier:

PDF, 169 KB

english, 2012

23

Molecular Genetic Changes in Metastatic Primary Barrett’s Adenocarcinoma and Related Lymph Node Metastases: Comparison with Nonmetastatic Barrett’s Adenocarcinoma

Bink, Karin, Hutzler, Peter, Bruch, Jochen, Braselmann, Herbert, Aubele, Michaela M., Mueller, James, Stein, Hubert, Siewert, Jörg R., Walch, Axel K., Zitzelsberger, Horst F.

Journal:

Modern Pathology

Année:

2000

Langue:

english

Fichier:

PDF, 828 KB

english, 2000

24

Macrolide-based transgene control in mammalian cells and mice

Weber, Wilfried, Fux, Cornelia, Daoud-El Baba, Marie, Keller, Bettina, Weber, Cornelia C., Kramer, Beat P., Heinzen, Christoph, Aubel, Dominique, Bailey, James E., Fussenegger, Martin

Journal:

Nature Biotechnology

Année:

2002

Langue:

english

Fichier:

PDF, 1.95 MB

english, 2002

25

An engineered epigenetic transgene switch in mammalian cells

Kramer, Beat P, Viretta, Alessandro Usseglio, Baba, Marie Daoud-El, Aubel, Dominique, Weber, Wilfried, Fussenegger, Martin

Journal:

Nature Biotechnology

Année:

2004

Langue:

english

Fichier:

PDF, 166 KB

english, 2004

26

Senegalese grandmothers promote improved maternal and child nutrition practices: the guardians of tradition are not averse to change

Judi Aubel, Ibrahima Touré, Mamadou Diagne

Journal:

Social Science & Medicine

Année:

2004

Langue:

english

Fichier:

PDF, 284 KB

english, 2004

27

Patterns of volcanism along the southern margin of the Colorado Plateau: The Springerville Field

Condit, Christopher D., Crumpler, L. S., Aubele, Jayne C., Elston, Wolfgang E.

Journal:

Journal of Geophysical Research

Année:

1989

Langue:

english

Fichier:

PDF, 1.08 MB

english, 1989

28

Grain structure analysis and effect on electromigration reliability in nanoscale Cu interconnects

Cao, Linjun, Ganesh, K. J., Zhang, Lijuan, Aubel, Oliver, Hennesthal, Christian, Hauschildt, Meike, Ferreira, Paulo J., Ho, Paul S.

Journal:

Applied Physics Letters

Année:

2013

Langue:

english

Fichier:

PDF, 1.42 MB

english, 2013

29

High van Hove singularity extension and Fermi velocity increase in epitaxial graphene functionalized by intercalated gold clusters

Nair, M. N., Cranney, M., Vonau, F., Aubel, D., Le Fèvre, P., Tejeda, A., Bertran, F., Taleb-Ibrahimi, A., Simon, L.

Journal:

Physical Review B

Année:

2012

Langue:

english

Fichier:

PDF, 2.13 MB

english, 2012

30

Synthetic mammalian gene circuits for biomedical applications

Ye, Haifeng, Aubel, Dominique, Fussenegger, Martin

Journal:

Current Opinion in Chemical Biology

Année:

2013

Langue:

english

Fichier:

PDF, 2.40 MB

english, 2013

31

COS-OGA: A novel oligosaccharidic elicitor that protects grapes and cucumbers against powdery mildew

van Aubel, Géraldine, Buonatesta, Raffael, Van Cutsem, Pierre

Journal:

Crop Protection

Année:

2014

Langue:

english

Fichier:

PDF, 1017 KB

english, 2014

32

Identification of Differentially Expressed Proteins in Triple-Negative Breast Carcinomas Using DIGE and Mass Spectrometry

Schulz, Daniela M., Böllner, Claudia, Thomas, Gerry, Atkinson, Mike, Esposito, Irene, Höfler, Heinz, Aubele, Michaela

Journal:

Journal of Proteome Research

Année:

2009

Langue:

english

Fichier:

PDF, 1.89 MB

english, 2009

33

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Mechanical characterization of copper based metallizations with different via-bottom geometries

Ciptokusumo, Johar, Weide-Zaage, Kirsten, Aubel, Oliver

Année:

2010

Langue:

english

Fichier:

PDF, 729 KB

english, 2010

34

Multicenter Matrix-Assisted Laser Desorption/Ionization Mass Spectrometry Imaging (MALDI MSI) Identifies Proteomic Differences in Breast-Cancer-Associated Stroma

Dekker, Tim J. A., Balluff, Benjamin D., Jones, Emrys A., Schöne, Cédrik D., Schmitt, Manfred, Aubele, Michaela, Kroep, Judith R., Smit, Vincent T. H. B. M., Tollenaar, Rob A. E. M., Mesker, Wilma E.,

Journal:

Journal of Proteome Research

Année:

2014

Langue:

english

Fichier:

PDF, 9.55 MB

english, 2014

35

Empirical BEOL-TDDB evaluation based on I(t)-trace analysis

Aubel, O., Beyer, A., Talut, G., Gall, M.

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 851 KB

english, 2014

36

A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28nm node

Wan, Xinggong, Chandrashekhar, Sandhya, Bayha, Boris, Trentzsch, Martin, Balzer, Torben, Siddabathula, Mahesh, Aubel, Oliver

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 985 KB

english, 2014

37

Robust Electromigration reliability through engineering optimization

Ng, Wee Loon, Tee, Kheng Chok, Liu, Junfeng, Ee, Yong Chiang, Aubel, Oliver, Tan, Chuan Seng, Pey, Kin Leong

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 1.28 MB

english, 2014

38

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Effects of cap layer and grain structure on electromigration reliability of Cu/low-k interconnects for 45 nm technology node

Zhang, L., Zhou, J. P., Im, J., Ho, P. S., Aubel, O., Hennesthal, C., Zschech, E.

Année:

2010

Langue:

english

Fichier:

PDF, 1.63 MB

english, 2010

39

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - New approach of 90nm low-k interconnect evaluation using a voltage ramp dielectric breakdown (VRDB) test

Aubel, O., Kiene, M., Yao, W.

Année:

2005

Langue:

english

Fichier:

PDF, 1.02 MB

english, 2005

40

Calderas on Mars: characteristics, structure, and associated flank deformation

Crumpler, L. S., Head, J. W., Aubele, J. C.

Journal:

Geological Society London Special Publications

Année:

1996

Langue:

english

Fichier:

PDF, 20.06 MB

english, 1996

41

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Investigation of via Bottom Barrier Integrity Impact on Electromigration

Aubel, O., Thierbach, S., Koschinsky, F., Feustel, F., Hau-Riege, C.S., Zistl, C.

Année:

2007

Langue:

english

Fichier:

PDF, 2.23 MB

english, 2007

42

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Non-destructive current-ramp dielectric breakdown (IRDB) for fast BEOL reliability monitoring

Yiang, Kok-Yong, Francis, Rick, Marathe, Amit, Aubel, Oliver

Année:

2010

Langue:

english

Fichier:

PDF, 284 KB

english, 2010

43

Real-time display of virtual humans: levels of details and impostors

Aubel, A., Boulic, R., Thalmann, D.

Journal:

IEEE Transactions on Circuits and Systems for Video Technology

Année:

2000

Langue:

english

Fichier:

PDF, 635 KB

english, 2000

44

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Reliability Challenges in Copper Metallizations arising with the PVD Resputter Liner Engineering for 65nm and Beyond

Fischer, A.H., Aubel, O., Gill, J., Lee, T.C., Li, B., Christiansen, C., Chen, F., Angyal, M., Bolom, T., Kaltalioglu, E.

Année:

2007

Langue:

english

Fichier:

PDF, 426 KB

english, 2007

45

grown on Ge(001)

Stoehr, M., Aubel, D., Juillaguet, S., Bischoff, J. L., Kubler, L., Bolmont, D., Hamdani, F., Fraisse, B., Fourcade, R.

Journal:

Physical Review B

Année:

1996

Langue:

english

Fichier:

PDF, 95 KB

english, 1996

46

The continuing Cambodian tragedy

van Aubel, A. N.

Journal:

Année:

1990

Langue:

english

Fichier:

PDF, 500 KB

english, 1990

47

Lattice damage and atomic mixing induced by As++ implantation and thermal annealing in AlAs/GaAs multiple quantum-well structures

D. Huang, M. Kallergi, J. Aubel, S. Sundaram, G. Desalvo, J. Comas

Année:

1991

Langue:

english

Fichier:

PDF, 1.33 MB

english, 1991

48

Competency-Based General Physics Instruction with a One-Man Staff

Journal:

American Journal of Physics

Année:

1974

Langue:

english

Fichier:

PDF, 838 KB

english, 1974

49

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Process options for improving electromigration performance in 32nm technology and beyond

Aubel, O., Hohage, J., Feustel, F., Hennesthal, C., Mayer, U., Preusse, A., Nopper, M., Lehr, M. U., Boemmels, J., Wehner, S.

Année:

2009

Langue:

english

Fichier:

PDF, 454 KB

english, 2009

50

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Comprehensive reliability analysis of CoWP Metal Cap unit processes for high volume production in sub-μm dimensions

Aubel, O., Thierbach, S., Seidel, R., Freudenberg, B., Meyer, M.A., Feustel, F., Poppe, J., Nopper, M., Preusse, A., Zistl, C., Weide-Zaage, K.

Année:

2008

Langue:

english

Fichier:

PDF, 322 KB

english, 2008